military and commercial temperature ranges idt54/74fct541/a/c fast cmos octal buffer/line driver 1 june 2002 military and commercial temperature ranges the idt logo is a registered trademark of integrated device technology, inc. ? 2002 integrated device technology, inc. dsc-5429/4 features: ? idt54fct541 equivalent to fast? speed and drive ? idt54/74FCT541A up to 25% faster than fast ? idt74fct541c up to 55% faster than fast ?i ol = 64ma (commercial) and 48ma (military) ? cmos power levels (1mw typ. static) ? military product compliant to mil-std-883, class b ? meets or exceeds jedec standard 18 specifications ? available in the following packages: ? commercial: soic ? military: cerdip, lcc functional block diagram idt54/74fct541/a/c fast cmos octal buffer/line driver description: the idt octal buffer/line drivers are built using an advanced dual metal cmos technology. the fct541 is designed to be employed as a memory and address driver, clock driver and bus-oriented transmitter/receiver which provides improved board density. the fct541 is similar in function to the fct244, except that the inputs and outputs are on opposite sides of the package. this pinout arrangement makes these devices especially useful as output ports for microprocessors and as backplane drivers, allowing ease of layout and greater board density. d 1 d 2 d 3 d 4 d 5 d 6 d 7 d 0 o 0 o 1 o 2 o 3 o 4 o 5 o 6 o 7 oe a oe b 1 3 2 4 5 6 7 8 9 11 12 13 14 15 16 17 18 19
military and commercial temperature ranges 2 idt54/74fct541/a/c fast cmos octal buffer/line driver pin configuration cerdip/ soic top view lcc top view symbol rating commercial military unit v term (2) terminal voltage ?0.5 to +7 ?0.5 to +7 v with respect to gnd v term (3) terminal voltage ?0.5 to v cc ?0.5 to v cc v with respect to gnd t a operating temperature 0 to +70 ?55 to +125 c t bias temperature under bias ?55 to +125 ?65 to +135 c t stg storage temperature ?55 to +125 ?65 to +150 c p t power dissipation 0.5 0.5 w i out dc output current 120 120 ma absolute maximum ratings (1) notes: 1. stresses greater than those listed under absolute maximum ratings may cause permanent damage to the device. this is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. exposure to absolute maximum rating conditions for extended periods may affect reliability. no terminal voltage may exceed vcc by +0.5v unless otherwise noted. 2. input and vcc terminals only. 3. output and i/o terminals only. symbol parameter (1) conditions typ. max. unit c in input capacitance v in = 0v 6 10 pf c out output capacitance v out = 0v 8 12 pf capacitance (t a = +25c, f = 1.0mhz) note: 1. this parameter is measured at characterization but not tested. 2 3 1 16 15 14 11 19 18 20 17 13 12 5 6 7 4 8 9 10 oe a d 2 d 0 d 1 d 3 d 6 d 4 d 5 d 7 v cc gnd oe b o 2 o 0 o 1 o 3 o 6 o 4 o 5 o 7 1 2 3 4 5 7 9 6 8 10 11 12 13 14 15 16 17 18 19 20 o 2 o 0 o 1 o 3 o 4 d 1 d 0 d 7 g n d o 7 o 6 o 5 o e a v c c o e b index d 2 d 3 d 6 d 4 d 5 pin names description oe a , oe b 3-state output enable inputs (active low) d x inputs o x outputs pin description note: 1. h = high voltage level x = don?t care l = low voltage level z = high impedance function table (1) inputs output oe a oe b dx ox ll l l ll h h hh x z
military and commercial temperature ranges idt54/74fct541/a/c fast cmos octal buffer/line driver 3 symbol parameter test conditions (1) min. typ. (2) max. unit v ih input high level guaranteed logic high level 2 ? ? v v il input low level guaranteed logic low level ? ? 0.8 v i ih input high current v i = v cc ?? 5 v cc = max. v i = 2.7v ? ? 5 (4) a i il input low current v i = 0.5v ? ? ?5 (4) v i = gnd ? ? ?5 i ozh v o = v cc ?? 10 off state (high impedance) v cc = max. v o = 2.7v ? ? 10 (4) a i ozl output current v o = 0.5v ? ? ?10 (4) v o = gnd ? ? ?10 v ik clamp diode voltage v cc = min., i in = ?18ma ? ?0.7 ?1.2 v i os short circuit current v cc = max., v o = gnd (3) ?60 ?120 ? ma v oh output high voltage v cc = 3v, v in = v lc or v hc , i oh = ?32 av hc v cc ? v cc = min i oh = ?300 av hc v cc ?v v in = v ih or v il i oh = ?12ma mil 2.4 4.3 ? i oh = ?15ma com'l 2.4 4.3 ? v ol output low voltage v cc = 3v, v in = v lc or v hc , i ol = 300 a ? gnd v lc v cc = min i ol = 300 a ? gnd v lc (4) v v in = v ih or v il i ol = 48ma mil ? 0.3 0.55 i ol = 64ma com'l ? 0.3 0.55 dc electrical characteristics over operating range following conditions apply unless otherwise specified: v lc = 0.2v; v hc = v cc - 0.2v commercial: t a = 0c to +70c, v cc = 5.0v 5%, military: t a = -55c to +125c, v cc = 5.0v 10% notes: 1. for conditions shown as min. or max., use appropriate value specified under electrical characteristics for the applicable dev ice type. 2. typical values are at v cc = 5.0v, +25c ambient and maximum loading. 3. not more than one output should be tested at one time. duration of the test should not exceed one second. 4. this parameter is guaranteed but not ttested.
military and commercial temperature ranges 4 idt54/74fct541/a/c fast cmos octal buffer/line driver symbol parameter test conditions (1) min. typ. (2) max. unit i cc quiescent power supply current v cc = max. ? 0.2 1.5 ma v in v hc ; v in v lc ? i cc quiescent power supply current v cc = max. ? 0.5 2 ma ttl inputs high v in = 3.4v (3) i ccd dynamic power supply v cc = max. v in v hc ? 0.15 0.25 ma/ current (4) outputs open v in v lc mhz oe a = oe b = gnd or oe a = gnd one input toggling 50% duty cycle i c total power supply current (6) v cc = max. v in v hc ? 1.7 4 ma outputs open v in v lc fi = 10mhz (fct) 50% duty cycle oe a = oe b = gnd or v in = 3.4v ? 2 5 oe a = gnd v in = gnd one bit toggling v cc = max. v in v hc ? 3.2 6.5 (5) outputs open v in v lc fi = 2.5mhz (fct) 50% duty cycle oe a = oe b = gnd or v in = 3.4v ? 5.2 14.5 (5) oe a = gnd v in = gnd eight bits toggling notes: 1. for conditions shown as min. or max., use appropriate value specified under electrical characteristics for the applicable dev ice type. 2. typical values are at v cc = 5.0v, +25c ambient. 3. per ttl driven input; (v in = 3.4v). all other inputs at v cc or gnd. 4. this parameter is not directly testable, but is derived for use in total power supply calculations. 5. values for these conditions are examples of ? i cc formula. these limits are guaranteed but not tested. 6. i c = i quiescent + i inputs + i dynamic i c = i cc + ? i cc d h n t + i ccd (f cp /2+ f i n i ) i cc = quiescent current ? i cc = power supply current for a ttl high input (v in = 3.4v) d h = duty cycle for ttl inputs high n t = number of ttl inputs at d h i ccd = dynamic current caused by an input transition pair (hlh or lhl) f cp = clock frequency for register devices (zero for non-register devices) f i = output frequency n i = number of outputs at f i all currents are in milliamps and all frequencies are in megahertz. power supply characteristics v lc = 0.2v; v hc = v cc - 0.2v
military and commercial temperature ranges idt54/74fct541/a/c fast cmos octal buffer/line driver 5 switching characteristics over operating range - industrial 74FCT541A 74fct541c symbol parameter condition (1) min . (2) max . min . (2) max . unit t plh propagation delay c l = 50pf 1.5 4.8 1.5 4.1 ns t phl dx to ox r l = 500 ? t pzh output enable time 1.5 6.2 1.5 5.8 ns t pzl t phz output disable time 1.5 5.6 1.5 5.2 ns t plz switching characteristics over operating range - military 54fct541 54fct541a symbol parameter condition (1) min . (2) max . min . (2) max . unit t plh propagation delay c l = 50pf 1.5 9 1.5 5.1 ns t phl dx to ox r l = 500 ? t pzh output enable time 1.5 10.5 1.5 6.5 ns t pzl t phz output disable time 1.5 10 1.5 5.9 ns t plz notes: 1. see test circuit and waveforms. 2. minimum limits are guaranteed but not tested on propagation delays.
military and commercial temperature ranges 6 idt54/74fct541/a/c fast cmos octal buffer/line driver pulse generator r t d.u.t . v cc v in c l v out 50pf 500 ? 500 ? 7.0v 3v 1.5v 0v 3v 1.5v 0v 3v 1.5v 0v 3v 1.5v 0v data input timing input asynchronous control preset clear etc. synchronous control t su t h t rem t su t h high-low-high pulse low-high-low pulse t w 1.5v 1.5v same phase input transition 3v 1.5v 0v 1.5v v oh t plh output opposite phase input transition 3v 1.5v 0v t plh t phl t phl v ol control input 3v 1.5v 0v 3.5v 0v output normally low output normally high switch closed switch open v ol 0.3v 0.3v t plz t pzl t pzh t phz 3.5v 0v 1.5v 1.5v enable disable v oh preset clear clock enable etc. octal link octal link octal link octal link octal link test circuits and waveforms propagation delay test circuits for all outputs enable and disable times set-up, hold, and release times pulse width notes: 1. diagram shown for input control enable-low and input control disable-high. 2. pulse generator for all pulses: rate 1.0mhz; z o 50 ? ; t f 2.5ns; t r 2.5ns. test switch open drain disable low closed enable low all other tests open switch position definitions: c l = load capacitance: includes jig and probe capacitance. r t = termination resistance: should be equal to z out of the pulse generator.
military and commercial temperature ranges idt54/74fct541/a/c fast cmos octal buffer/line driver 7 ordering information corporate headquarters for sales: for tech support: 2975 stender way 800-345-7015 or 408-727-6116 logichelp@idt.com santa clara, ca 95054 fax: 408-492-8674 (408) 654-6459 www.idt.com idt xx temp. range xxxx device type xx package x process so commercial options small outline ic fast cmos octal buffer/line driver 54 74 ? 55 c to +125 c 0 c to +70 c d l military options cerdip leadless chip carrier blank b commercial mil-std-883, class b fct 541 541a 541c
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